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[IEEE 2012 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Providence, RI (2012.06.16-2012.06.21)] 2012 IEEE Conference on Computer Vision and Pattern Recognition - On SIFTs and their scales

✍ Scribed by Hassner, T.; Mayzels, V.; Zelnik-Manor, L.

Book ID: 121088156
Publisher: IEEE
Year: 2012
Weight: 749 KB
Category: Article
ISBN: 1467312274
DOI: 10.1109/CVPR.2012.6247842

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