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[IEEE 2012 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops) - Providence, RI, USA (2012.06.16-2012.06.21)] 2012 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops - Utilization of matching score vector similarity measures in biometric systems

✍ Scribed by Cheng, Xi; Tulyakov, Sergey; Govindaraju, Venu

Book ID: 118273372
Publisher: IEEE
Year: 2012
Weight: 366 KB
Category: Article
ISBN: 1467316105
DOI: 10.1109/cvprw.2012.6239224

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