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[IEEE 2012 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Amherst, MA, USA (2012.08.19-2012.08.21)] 2012 IEEE Computer Society Annual Symposium on VLSI - Analysis and Optimization of Thermal Effect on STT-RAM Based 3-D Stacked Cache Design

✍ Scribed by Bi, Xiuyuan; Li, Hai; Kim, Jae-Joon

No coin nor oath required. For personal study only.

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