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[IEEE 2012 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Amherst, MA, USA (2012.08.19-2012.08.21)] 2012 IEEE Computer Society Annual Symposium on VLSI - Binary Difference Based Test Data Compression for NoC Based SoCs

✍ Scribed by Chaki, Sanga; Giri, Chandan; Rahaman, Hafizur

Book ID: 115533542
Publisher: IEEE
Year: 2012
Weight: 182 KB
Category: Article
ISBN: 0769547672
DOI: 10.1109/isvlsi.2012.26

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