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[IEEE 2012 IEEE Asian Solid State Circuits Conference (A-SSCC) - Kobe, Japan (2012.11.12-2012.11.14)] 2012 IEEE Asian Solid State Circuits Conference (A-SSCC) - Wireless wafer probing for on-chip analog voltage measurement

✍ Scribed by Lee, Dae Young; Wentzloff, David D.; Hayes, John P.

Book ID: 121216800
Publisher: IEEE
Year: 2012
Weight: 435 KB
Volume: 7
Category: Article
DOI: 10.1109/IPEC.2012.6522691

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