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[IEEE 2012 IEEE Applied Power Electronics Conference and Exposition - APEC 2012 - Orlando, FL, USA (2012.02.5-2012.02.9)] 2012 Twenty-Seventh Annual IEEE Applied Power Electronics Conference and Exposition (APEC) - Temperature dependent Pspice model of silicon carbide power MOSFET

✍ Scribed by Cui, Yutian; Chinthavali, Madhu; Tolbert, Leon M.

Book ID: 126584468
Publisher: IEEE
Year: 2012
Weight: 721 KB
Category: Article
ISBN: 1457712148
DOI: 10.1109/APEC.2012.6166050

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