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[IEEE 2012 IEEE Applied Power Electronics Conference and Exposition - APEC 2012 - Orlando, FL, USA (2012.02.5-2012.02.9)] 2012 Twenty-Seventh Annual IEEE Applied Power Electronics Conference and Exposition (APEC) - Experimental investigation of Si IGBT short circuit capability at 200°C

✍ Scribed by Xu, Zhuxian; Wang, Fred

Book ID: 115484176
Publisher: IEEE
Year: 2012
Weight: 997 KB
Volume: 0
Category: Article
ISBN: 1457712148
DOI: 10.1109/apec.2012.6165814

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