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[IEEE 2012 IEEE 7th Nanotechnology Materials and Devices Conference (NMDC) - Waikiki Beach, HI, USA (2012.10.16-2012.10.19)] 2012 IEEE Nanotechnology Materials and Devices Conference (NMDC2012) - In situ electrical resistivity measurement of self assembled Cu3Si nanowires on Si(111)

✍ Scribed by Ng, Poh-Keong; Cheng, Jian-Yih; Fisher, Brandon; Lilley, Carmen M.

Book ID: 120545217
Publisher: IEEE
Year: 2012
Weight: 960 KB
Category: Article
ISBN: 1467328707
DOI: 10.1109/NMDC.2012.6527589

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