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[IEEE 2012 IEEE 58th Holm Conference on Electrical Contacts (Holm 2012) - Portland, OR, USA (2012.09.23-2012.09.26)] 2012 IEEE 58th Holm Conference on Electrical Contacts (Holm) - Characterization of Intermetallic Compounds in Al-Cu-Bimetallic Interfaces

✍ Scribed by Pfeifer, S.; Großmann, S.; Freudenberger, R.; Willing, H.; Kappl, H.

Book ID: 120606167
Publisher: IEEE
Year: 2012
Weight: 629 KB
Category: Article
ISBN: 1467307807
DOI: 10.1109/HOLM.2012.6336554

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