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[IEEE 2012 IEEE 27th Convention of Electrical & Electronics Engineers in Israel (IEEEI 2012) - Eilat, Israel (2012.11.14-2012.11.17)] 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel - Infant cry analysis and detection

✍ Scribed by Cohen, Rami; Lavner, Yizhar

Book ID: 118137513
Publisher: IEEE
Year: 2012
Weight: 434 KB
Category: Article
ISBN: 1467346802
DOI: 10.1109/eeei.2012.6376996

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