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[IEEE 2012 IEEE 23rd International Symposium on Software Reliability Engineering (ISSRE) - Dallas, TX, USA (2012.11.27-2012.11.30)] 2012 IEEE 23rd International Symposium on Software Reliability Engineering - On the Relative Strengths of Model-Based and Dynamic Event Extraction-Based GUI Testing Techniques: An Empirical Study

✍ Scribed by Bae, Gigon; Rothermel, Gregg; Bae, Doo-Hwan

Book ID: 127043399
Publisher: IEEE
Year: 2012
Weight: 430 KB
Category: Article
ISBN: 0769548881
DOI: 10.1109/issre.2012.18

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