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[IEEE 2012 IEEE 23rd International Symposium on Software Reliability Engineering (ISSRE) - Dallas, TX, USA (2012.11.27-2012.11.30)] 2012 IEEE 23rd International Symposium on Software Reliability Engineering - A Comprehensive Code-Based Quality Model for Embedded Systems: Systematic Development and Validation by Industrial Projects

✍ Scribed by Mayr, Alois (author);Plösch, Reinhold (author);Kläs, Michael (author);Lampasona, Constanza (author);Saft, Matthias (author)

Book ID
124093870
Publisher
IEEE
Year
2012
Weight
406 KB
Category
Article
ISBN
0769548881

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[IEEE 2012 IEEE 23rd International Sympo
[IEEE 2012 IEEE 23rd International Symposium on Software Reliability Engineering (ISSRE) - Dallas, TX, USA (2012.11.27-2012.11.30)] 2012 IEEE 23rd International Symposium on Software Reliability Engineering - A Comprehensive Code-Based Quality Model for Embedded Systems: Systematic Development and Validation by Industrial Projects
✍ Mayr, Alois (author);Plösch, Reinhold (author);Kläs, Michael (author);Lampasona, 📂 Article 📅 2012 🏛 IEEE ⚖ 406 KB