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[IEEE 2012 IEEE 16th Workshop on Signal and Power Integrity (SPI) - Sorrento, Italy (2012.05.13-2012.05.16)] 2012 IEEE 16th Workshop on Signal and Power Integrity (SPI) - SSO noise and conducted EMI: Modeling, analysis, and design solutions

✍ Scribed by Doriol, Patrice Joubert; Sanna, Aurora; Chandra, Akhilesh; Forzan, Cristiano; Pandini, Davide

Book ID: 111922058
Publisher: IEEE
Year: 2012
Weight: 909 KB
Category: Article
ISBN: 1467315028
DOI: 10.1109/sapiw.2012.6222922

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