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[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Effective RT-level software-based self-testing of embedded processor cores

✍ Scribed by Sha'afi Kabiri, Parisa; Navabi, Zainalabedin

Book ID: 120545162
Publisher: IEEE
Year: 2012
Weight: 231 KB
Category: Article
ISBN: 1467311863
DOI: 10.1109/DDECS.2012.6219059

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