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[IEEE 2012 IEEE 15th International Conference on Harmonics and Quality of Power (ICHQP) - Hong Kong, China (2012.06.17-2012.06.20)] 2012 IEEE 15th International Conference on Harmonics and Quality of Power - Type testing of a highly accurate illuminance flickermeter

✍ Scribed by Azcarate, I.; Gutierrez, J.J.; Lazkano, A.; Leturiondo, L.A.; Saiz, P.; Redondo, K.; Barros, J.

Book ID: 125479287
Publisher: IEEE
Year: 2012
Weight: 866 KB
Category: Article
ISBN: 1467319422
DOI: 10.1109/ichqp.2012.6381243

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