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[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Soft errors in advanced CMOS technologies

✍ Scribed by Schrimpf, R. D.; Alles, M. A.; Mamouni, F. El; Fleetwood, D. M.; Weller, R. A.; Reed, R. A.

Book ID: 121254389
Publisher: IEEE
Year: 2012
Weight: 535 KB
Category: Article
ISBN: 1467324736
DOI: 10.1109/ICSICT.2012.6467689

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