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[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - A 1.8V low noise threshold voltage reference generator with temperature and process calibration

✍ Scribed by Tao, Tingting; Fan, Chaojie; Chen, Dongpo; Zhou, Jianjun

Book ID: 120071244
Publisher: IEEE
Year: 2012
Weight: 275 KB
Category: Article
ISBN: 1467324736
DOI: 10.1109/ICSICT.2012.6467718

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