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[IEEE 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials (ICPADM) - Bangalore, India (2012.07.24-2012.07.28)] 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials - Impact of small voids in solid insulating materials

✍ Scribed by Lerchbacher, M.; Sumereder, C.; Lemesch, G.; Ramsauer, F.; Muhr, M.

Book ID: 121655985
Publisher: IEEE
Year: 2012
Weight: 701 KB
Category: Article
ISBN: 1467328502
DOI: 10.1109/ICPADM.2012.6318994

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