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[IEEE 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials (ICPADM) - Bangalore, India (2012.07.24-2012.07.28)] 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials - Failure analysis of Medium Voltage Cable accessories during qualification tests

✍ Scribed by Meena, K.P.; Rao, B.Nageshwar; Thirumurthy, ; Raja, G.K.

Book ID: 121265461
Publisher: IEEE
Year: 2012
Weight: 358 KB
Category: Article
ISBN: 1467328502
DOI: 10.1109/ICPADM.2012.6318989

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