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[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - A look at the sensitivity of the Thru-Reflect-Line vector network analyzer calibration algorithm

✍ Scribed by Eio, Christopher

Book ID: 126600388
Publisher: IEEE
Year: 2012
Weight: 122 KB
Category: Article
ISBN: 1467304417
DOI: 10.1109/CPEM.2012.6250640

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