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[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - Sampling ratio bridge for impedance measurements down to 1 mΩ

✍ Scribed by van den Brom, Helko E.; Dierikx, Erik F.; Jo, Leendert


Book ID
121382314
Publisher
IEEE
Year
2012
Weight
151 KB
Category
Article
ISBN
1467304417

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