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[IEEE 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012) - Washington, DC, USA (2012.07.1-2012.07.6)] 2012 Conference on Precision electromagnetic Measurements - High precision measurement of the load effect of the resistor

✍ Scribed by Lan, J.; Zhang, Z.; Li, Z.; He, Q.; Han, B.; Li, S.; Wang, G.

Book ID: 120203085
Publisher: IEEE
Year: 2012
Weight: 349 KB
Category: Article
ISBN: 1467304417
DOI: 10.1109/CPEM.2012.6250962

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