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[IEEE 2012 Conference on Optoelectronic and Microelectronic Materials & Devices (COMMAD) - Melbourne, Australia (2012.12.12-2012.12.14)] COMMAD 2012 - Magnetoresistance characterisation of 4H-SiC MOSFETs

✍ Scribed by Umana-Membreno, G. A.; Sharp, J.R.; Choudhary, A.; Antoszewski, J.; Dhar, S.; Ryu, S.-H.; Agarwal, A. K.; Faraone, L.

Book ID: 120240500
Publisher: IEEE
Year: 2012
Weight: 313 KB
Category: Article
ISBN: 1467330477
DOI: 10.1109/COMMAD.2012.6472423

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