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[IEEE 2012 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) - Singapore, Singapore (2012.05.21-2012.05.24)] 2012 Asia-Pacific Symposium on Electromagnetic Compatibility - Planar material sample fixture characterization and application for EMI shielding effectiveness evaluations

✍ Scribed by Shan, Yueyan; Li, Ping; Deng, Junhong

Book ID: 118146350
Publisher: IEEE
Year: 2012
Weight: 846 KB
Category: Article
ISBN: 1457715589
DOI: 10.1109/apemc.2012.6237804

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