𝔖 Bobbio Scriptorium

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[IEEE 2012 Annual Reliability and Maintainability Symposium (RAMS) - Reno, NV, USA (2012.01.23-2012.01.26)] 2012 Proceedings Annual Reliability and Maintainability Symposium - Best practices for fitting the 1-parameter Weibull distribution

✍ Scribed by Marquart, Todd A.

Book ID: 118000283
Publisher: IEEE
Year: 2012
Weight: 700 KB
Volume: 0
Category: Article
ISBN: 1457718502
DOI: 10.1109/rams.2012.6175495

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