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[IEEE 2012 7th International Conference on Electrical & Computer Engineering (ICECE) - Dhaka, Bangladesh (2012.12.20-2012.12.22)] 2012 7th International Conference on Electrical and Computer Engineering - Finite element analysis of thermal stress in Through-Silicon Via structure

โœ Scribed by Sultana, Tanzia; Alam, Md. Nafiul; Hossain, Md. Faruque


Book ID
127297387
Publisher
IEEE
Year
2012
Weight
778 KB
Category
Article
ISBN
1467314358

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