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[IEEE 2012 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Tunis, Tunisia (2012.05.16-2012.05.18)] 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - On optimizing test cost for Wafer-to-Wafer 3D-stacked ICs

✍ Scribed by Taouil, Mottaqiallah; Hamdioui, Said

Book ID: 120986655
Publisher: IEEE
Year: 2012
Weight: 501 KB
Category: Article
ISBN: 1467319279
DOI: 10.1109/DTIS.2012.6232983

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