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[IEEE 2012 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Tunis, Tunisia (2012.05.16-2012.05.18)] 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Test set embedding into low-power sequences based on a traveling salesman problem formulation

✍ Scribed by Voyiatzis, I.; Efstathiou, C.; Magos, D.; Sgouropoulou, C.

Book ID: 120182894
Publisher: IEEE
Year: 2012
Weight: 355 KB
Category: Article
ISBN: 1467319279
DOI: 10.1109/DTIS.2012.6232965

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