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[IEEE 2012 70th Annual Device Research Conference (DRC) - University Park, PA, USA (2012.06.18-2012.06.20)] 70th Device Research Conference - Dielectric thickness dependence of quantum capacitance in graphene varactors with local metal back gates

✍ Scribed by Ebrish, M. A.; Koester, S. J.

No coin nor oath required. For personal study only.

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