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[IEEE 2012 4th IEEE International Memory Workshop (IMW) - Milan, Italy (2012.05.20-2012.05.23)] 2012 4th IEEE International Memory Workshop - Investigation of Cycling-Induced VT Instabilities in NAND Flash Cells via Compact Modeling

✍ Scribed by Paolucci, G. M.; Miccoli, C.; Compagnoni, C. Monzio; Crespi, L.; Spinelli, A. S.; Lacaita, A. L.

No coin nor oath required. For personal study only.

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