[IEEE 2012 4th Asia Symposium on Quality Electronic Design (ASQED 2012) - Penang, Malaysia (2012.07.10-2012.07.11)] 2012 4th Asia Symposium on Quality Electronic Design (ASQED) - Field-based parasitic capacitance models for 2D and 3D sub-45-nm interconnect

✍ Scribed by Zhang, Aixi; Zhao, Wei; Zhu, Xiaoan; Deng, Wanling; He, Jin; Chen, Aixin; Chan, Mansun

• Book ID: 118034052
• Publisher: IEEE
• Year: 2012
• Weight: 692 KB
• Category: Article
• ISBN: 1467326860
• DOI: 10.1109/acqed.2012.6320485