[IEEE 2012 42nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) - Boston, MA, USA (2012.06.25-2012.06.28)] IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012) - VARIUS-NTV: A microarchitectural model to capture the increased sensitivity of manycores to process variations at near-threshold voltages

✍ Scribed by Karpuzcu, Ulya R.; Kolluru, Krishna B.; Kim, Nam Sung; Torrellas, Josep

• Book ID: 115512278
• Publisher: IEEE
• Year: 2012
• Weight: 477 KB
• Category: Article
• ISBN: 1467316237
• DOI: 10.1109/dsn.2012.6263951