[IEEE 2012 35th International Spring Sem
โฆ LIBER โฆ
[IEEE 2012 35th International Spring Seminar on Electronics Technology (ISSE) - Bad Aussee, Austria (2012.05.9-2012.05.13)] 2012 35th International Spring Seminar on Electronics Technology - Phase thickness deviations' influence on properties of antireflection coatings for near infrared detectors
โ Scribed by Gyoch, B.; Mashkov, P.; Penchev, S.
- Book ID
- 118736715
- Publisher
- IEEE
- Year
- 2012
- Weight
- 244 KB
- Category
- Article
- ISBN
- 1467322393
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