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[IEEE 2012 25th International Vacuum Nanoelectronics Conference (IVNC) - Jeju, Korea (South) (2012.07.9-2012.07.13)] 25th International Vacuum Nanoelectronics Conference - Field emission current noise analysis of carbon based materials

✍ Scribed by More, Mahendra A.; Kashid, Ranjit V.; Patil, Sandip S.; Shinde, Deodatta R.; Joag, Dilip S.

Book ID: 126745849
Publisher: IEEE
Year: 2012
Weight: 102 KB
Category: Article
ISBN: 1467319821
DOI: 10.1109/IVNC.2012.6316832

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