[IEEE 2012 24th International Conference on Indium Phosphide & Related Materials (IPRM) - Santa Barbara, CA, USA (2012.08.27-2012.08.30)] 2012 International Conference on Indium Phosphide and Related Materials - Analysis of InP/GaAsSb DHBT failure mechanisms under accelerated aging tests

✍ Scribed by Kone, G.A.; Maneux, C.; Labat, N.; Zimmer, T.; Grandchamp, B.; Frijlink, P.; Maher, H.

• Book ID: 124085942
• Publisher: IEEE
• Year: 2012
• Weight: 808 KB
• Category: Article
• ISBN: 1467317233
• DOI: 10.1109/ICIPRM.2012.6403359