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[IEEE 2012 23rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY (2012.05.15-2012.05.17)] 2012 SEMI Advanced Semiconductor Manufacturing Conference - A comparison of data mining methods for yield modeling, chamber matching and virtual metrology applications

✍ Scribed by Sharma, D.; Armer, H.; Moyne, J.

Book ID: 111962435
Publisher: IEEE
Year: 2012
Weight: 387 KB
Category: Article
ISBN: 146730350X
DOI: 10.1109/asmc.2012.6212896

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