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[IEEE 2012 13th Latin American Test Workshop - LATW - Quito, Ecuador (2012.04.10-2012.04.13)] 2012 13th Latin American Test Workshop (LATW) - Non-intrusive fault tolerance in soft processors through circuit duplication

✍ Scribed by Ferlini, Frederico; da Silva, Felipe A.; Bezerra, Eduardo A.; Lettnin, Djones V.

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