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[IEEE 2012 11th IEEE International Conference on Cognitive Informatics & Cognitive Computing (ICCI*CC) - Kyoto, Japan (2012.08.22-2012.08.24)] 2012 IEEE 11th International Conference on Cognitive Informatics and Cognitive Computing - The multi-deformable assembly contact analysis of rotate test tree

โœ Scribed by Liu, Jinghua; Hu, Guichuan


Book ID
115479866
Publisher
IEEE
Year
2012
Weight
256 KB
Category
Article
ISBN
142449561X

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