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[IEEE 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) - Tokyo, Japan (2011.09.29-2011.09.29)] 2011 Workshop on Fault Diagnosis and Tolerance in Cryptography - A Differential Fault Analysis on AES Key Schedule Using Single Fault

โœ Scribed by Ali, Sk. Subidh; Mukhopadhyay, Debdeep


Book ID
120326291
Publisher
IEEE
Year
2011
Weight
356 KB
Category
Article
ISBN
1457714639

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