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[IEEE 2011 International SoC Design Conference (ISOCC 2011) - Jeju, Korea (South) (2011.11.17-2011.11.18)] 2011 International SoC Design Conference - Statistical modeling of capacitor mismatch effects for successive approximation register ADCs

✍ Scribed by Lee, YoungJoo; Song, Jinook; Park, In-Cheol

Book ID: 120826223
Publisher: IEEE
Year: 2011
Weight: 751 KB
Category: Article
ISBN: 1457707101
DOI: 10.1109/ISOCC.2011.6138770

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