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[IEEE 2011 International Semiconductor Device Research Symposium (ISDRS) - College Park, MD, USA (2011.12.7-2011.12.9)] 2011 International Semiconductor Device Research Symposium (ISDRS) - Comparison of silicon-on-insulator and Body-on-Insulator FinFET based digital circuits with consideration on self-heating effects

✍ Scribed by Feng, Peijie; Ghosh, Prasanta

Book ID: 121257805
Publisher: IEEE
Year: 2011
Weight: 344 KB
Category: Article
ISBN: 1457717557
DOI: 10.1109/ISDRS.2011.6135230

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