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[IEEE 2011 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE) - Xi'an, China (2011.06.17-2011.06.19)] 2011 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering - Comparison of two quality control models for short run process based on Bayesian analysis

✍ Scribed by Huang, Qinwen; Fang, Wenxiao; Liu, Jian

Book ID: 126750659
Publisher: IEEE
Year: 2011
Weight: 815 KB
Category: Article
ISBN: 1457712296
DOI: 10.1109/ICQR2MSE.2011.5976604

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