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[IEEE 2011 International Conference on Future Computer Sciences and Application (ICFCSA) - Hong Kong, TBD, China (2011.06.18-2011.06.19)] 2011 International Conference on Future Computer Sciences and Application - The Research on Software Test Pattern

✍ Scribed by Yi-chen, Wang; Yi-kun, Wang

Book ID: 121677001
Publisher: IEEE
Year: 2011
Weight: 339 KB
Category: Article
ISBN: 1457703173
DOI: 10.1109/ICFCSA.2011.32

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