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[IEEE 2011 International Conference on Electronics and Optoelectronics (ICEOE) - Dalian, Liaoning, China (2011.07.29-2011.07.31)] Proceedings of 2011 International Conference on Electronics and Optoelectronics - Laser induced rear-surface-crack damage properties of HF etched fused silica

✍ Scribed by Wang Fengrui, ; Huang Jin, ; Liu Hongjie, ; Zhou Xinda, ; Jiang Xiaodong, ; Wu Weidong, ; Zheng Wanguo,

Book ID: 127148120
Publisher: IEEE
Year: 2011
Weight: 340 KB
Category: Article
ISBN: 1612842755
DOI: 10.1109/iceoe.2011.6013388

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