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[IEEE 2011 International Conference on Document Analysis and Recognition (ICDAR) - Beijing, China (2011.09.18-2011.09.21)] 2011 International Conference on Document Analysis and Recognition - Enhanced Active Contour Method for Locating Text

✍ Scribed by Navon, Yaakov; Kluzner, Vladimir; Ophir, Boaz

Book ID: 115446550
Publisher: IEEE
Year: 2011
Weight: 867 KB
Volume: 0
Category: Article
ISBN: 1457713500
DOI: 10.1109/icdar.2011.53

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