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[IEEE 2011 International Conference on Anti-Counterfeiting, Security and Identification (2011 ASID) - Xiamen, China (2011.06.24-2011.06.26)] 2011 IEEE International Conference on Anti-Counterfeiting, Security and Identification - A novel sub-1-V bandgap reference in 0.18µm CMOS technology

✍ Scribed by Tan, Min; Liu, Fan; Fei Xiang,

Book ID: 120226326
Publisher: IEEE
Year: 2011
Weight: 186 KB
Category: Article
ISBN: 1612846319
DOI: 10.1109/ASID.2011.5967446

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