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[IEEE 2011 IEEE/ACM International Symposium on Nanoscale Architectures (NANOARCH) - San Diego, CA, USA (2011.06.8-2011.06.9)] 2011 IEEE/ACM International Symposium on Nanoscale Architectures - A unified aging model of NBTI and HCI degradation towards lifetime reliability management for nanoscale MOSFET circuits

✍ Scribed by Yao Wang, ; Cotofana, Sorin; Liang Fang,

Book ID: 120177773
Publisher: IEEE
Year: 2011
Weight: 320 KB
Category: Article
ISBN: 1457709937
DOI: 10.1109/NANOARCH.2011.5941501

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