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[IEEE 2011 IEEE Workshops of International Conference on Advanced Information Networking and Applications (WAINA) - Biopolis, Singapore (2011.03.22-2011.03.25)] 2011 IEEE Workshops of International Conference on Advanced Information Networking and Applications - The Degree of Masking Fault Tolerance vs. Temporal Redundancy

✍ Scribed by Müllner, Nils; Theel, Oliver

Book ID: 120380551
Publisher: IEEE
Year: 2011
Weight: 421 KB
Category: Article
ISBN: 161284829X
DOI: 10.1109/WAINA.2011.137

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