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[IEEE 2011 Ieee Symposium On Computational Intelligence And Data Mining - Part Of 17273 - 2011 Ssci - Paris, France (2011.04.11-2011.04.15)] 2011 IEEE Symposium on Computational Intelligence and Data Mining (CIDM) - A robust F-measure for evaluating discovered process models

โœ Scribed by De Weerdt, Jochen; De Backer, Manu; Vanthienen, Jan; Baesens, Bart


Book ID
126659878
Publisher
IEEE
Year
2011
Weight
147 KB
Category
Article
ISBN
1424499267

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