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[IEEE 2011 IEEE Regional Symposium on Micro and Nanoelectronics (RSM) - Kota Kinabalu, Sabah, Malaysia (2011.09.28-2011.09.30)] 2011 IEEE Regional Symposium on Micro and Nano Electronics - Design and simulation of a MEMS capacitive bending strain sensor using dielectric materials for spinal fusion monitoring

✍ Scribed by Mokti, Muhammad Irsyad Abdul; Rahim, Inzarulfaisham Abd.; Manaf, Asrulnizam Abd; Sidek, Othman Bin; Miskam, Muhamad Azman Bin

Book ID: 120578690
Publisher: IEEE
Year: 2011
Weight: 976 KB
Category: Article
ISBN: 1612848451
DOI: 10.1109/RSM.2011.6088354

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